Home>CALL FOR PAPER

2022 2nd International Conference on Testing Technology and Automation Engineering (TTAE 2022)

2022/8/26-2022/8/28

Online

CALL FOR PAPER

2022 2nd International Conference on Testing Technology and Automation Engineering (TTAE 2022) accepts original and unpublished papers. The papers may include but are not limited to:

Automation Engineering

Navigation, guidance and control

Inertial technology and navigation equipment

Navigation and positioning of motion carrier

Information Fusion and Intelligent Control

Intelligent instrument control technology

GNSS technology and its application

New control technology and its application in navigation

Precision instruments and machinery

Micro electromechanical systems and micro robots

Bionic machinery, intelligent machinery, special robot intelligent

Machinery and its motion control

Application technology and new technology of system design       and automation

Sensor wireless transmission network and field bus control technology

Instrument embedded technology and network control technology

Systems Engineering

Theory and Application

Intelligent, networked and integrated modern detection  technology and system

Robot vision

New sensor and data fusion technology

Fuzzy logic control system

Introduction to fuzzy and neural network engineering

Manufacture industrial automation equipment and systems

Wireless sensor network technology

Principles and applications of artificial intelligence

Intelligent methods and techniques

Testing Technology

Modern Testing Technology

Technical basis for integrated system development

Automatic test theory

Measurement techniques and instruments

Complex system modeling and simulation

MATLAB system analysis language and application

Multi-sensor fusion theory and application

Optimal estimation and system identification

Artificial neural network

On-line testing and nondestructive testing technology

Fuzzy Theory and Applications

Photoelectric detection and computer vision detection technology

Genetic algorithms and evolutionary algorithms

Control network and fieldbus

Micro nano detection

Intelligent instrument

Remote sensing and telemetry

Modeling and Simulation

Modeling and Simulation

Other related topic