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CALL FOR PAPER

2022 2nd International Conference on Testing Technology and Automation Engineering (TTAE 2022) accepts original and unpublished papers. The papers may include but are not limited to:

Automation Engineering

l Navigation, guidance and control

l Inertial technology and navigation equipment

l Navigation and positioning of motion carrier

l Information Fusion and Intelligent Control

l Intelligent instrument control technology

l GNSS technology and its application

l New control technology and its application in navigation

l Precision instruments and machinery

l Micro electromechanical systems and micro robots

l Bionic machinery, intelligent machinery, special robot intelligent

l Machinery and its motion control

l Application technology and new technology of system design       and automation

l Sensor wireless transmission network and field bus control technology

l Instrument embedded technology and network control technology

l Systems Engineering

l Theory and Application

l Intelligent, networked and integrated modern detection  technology and system

l Robot vision

l New sensor and data fusion technology

l Fuzzy logic control system

l Introduction to fuzzy and neural network engineering

l Manufacture industrial automation equipment and systems

l Wireless sensor network technology

l Principles and applications of artificial intelligence

l Intelligent methods and techniques

Testing Technology

l Modern Testing Technology

l Technical basis for integrated system development

l Automatic test theory

l Measurement techniques and instruments

l Complex system modeling and simulation

l MATLAB system analysis language and application

l Multi-sensor fusion theory and application

l Optimal estimation and system identification

l Artificial neural network

l On-line testing and nondestructive testing technology

l Fuzzy Theory and Applications

l Photoelectric detection and computer vision detection technology

l Genetic algorithms and evolutionary algorithms

l Control network and fieldbus

l Micro nano detection

l Intelligent instrument

l Remote sensing and telemetry

l Modeling and Simulation

l Modeling and Simulation

Other related topic

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