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CALL FOR PAPER


Topics of interest for submission include, but are not limited to:

Mechanical Automation

Electronic Information Engineering

1. CNC technology and CNC system

2. Intelligent manufacturing technology

3. Test techniques and troubleshooting

4. Computer Integrated Manufacturing Systems (CIMS)

5. Control engineering

6. Molding manufacturing and automation

7. Optoelectronic engineering

8. Instrument Science and Technology

9. Thermal power equipment

10. Fluid Machinery and Engineering

11. Vehicles and carriages

12. Mechatronics

13. Artificial intelligence

14. Automatic control and technology

15. Automated instrumentation and equipment

16. Mechanical engineering

17. Factory modeling and automation

18. Circuits and systems

19. Communications and Information Systems

20. Electronic systems

      21. Human-computer interaction and mechatronic engineering

1. Power electronics technology

2. Communication signal processing

3. Radar Engineering

4. Digital signal processing

5. Electromagnetic fields and electromagnetic waves

6. Electromagnetic fields and electromagnetic waves

7. Signal and image processing

8. Automatic control and intelligent control

9. Computer and network technology

10. Network and office automation technology

11. Multimedia technology

12. Microcontroller technology

13. Electronic system design process

14. Electronic Design Automation (EDA) technology

15. Circuits and systems

16. Smart meters

17. Communications and information systems

18. Communications and information systems

19. Signal and information processing

20. Parallel and distributed computing

21. Electronics and Communication Engineering

22. Power electronics and electric drives

23. Optoelectronic Information Engineering

24. Physical Electronics

25. Electronic systems

26. Artificial neural networks

27. Semiconductor devices

28. Microprocessor

29. Photonic technology

30. Aerospace electronics technology

31. Electromagnetic fields and microwaves

32. Information processing

      33. Measuring and testing technology and instrumentation

* Other Related Research

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